Optical characterization of reduced graphene oxide films as transparent conductive materials

Abstract

Graphene oxide films were successfully prepared via the modified Hummer method. The deposition of the material was done by the spin coating method. Profilometry results showed the thickness of these reduced graphene composite films ranging from 130 – 900nm, which shows that the more layers, the better transparency it produces. The optical characterization Ultraviolent (UV) spectroscopy was carried out using a UV 752 ultraviolet-visible-near infrared (UV-VIS-NI) spectrophotometer, at the wavelength interval of 250 nm to 1100 nm, while the Tauc model was used to obtain the optical band gap. The optical band gap of the graphene oxide films was 2.2 eV, 2.3 eV, 2.1 eV, 2.4 eV, and 2.0 eV respectively, which showed that the reduced graphene oxide films possess excellent optical response and outstanding thermal stability.